The Design and Implementation of a Single, Double, and Triple Concurrent Beam In Situ Ion Irradiation TEM Facility

The study of irradiation-induced defects on the nanoscale is crucial for a fundamental understanding of displacement and implantation damage in various microstructures. Ion irradiation performed in situ inside of a TEM is a unique tool allowing direct observation of defect evolution on nanometer length scales in real time [1]. Most facilities use a single ion beam, but in many real radiation environments components are exposed simultaneously to a variety of particles with a spectrum of energies, while internal fission may create additional isotopes. Some studies have attempted to simulate the effects of multiple species by pre-implantation or sequential application of beams, however, several investigations [2-4] have revealed different defect behavior during sequential and concurrent application of the same beams. Knowledge of synergistic defect interactions during multiple beam irradiation is critical to understanding and predicting material behavior in complex radiation environments, like nuclear reactors, but cannot be reliably obtained with single beams.